This project is an effort to improve the firmware of the Radtel RT-890 in terms of features and radio performance. It is based on DualTachyon's OEFW which is reversed from the original Radtel 1.34 ...

Microsoft has announced that Surface is joining the Open Device Partnership (ODP). For the uninitiated, it’s an open-source initiative focused on creating a safer and more standardized foundation for ...

Samsung seems to be moving quickly toward its next major software update. According to a new report from SamMobile, the site managed to dig into leaked One UI 8.5 firmware and discovered that Samsung ...

Apple has released iOS 26 and iPadOS 26 for the general public. The update is now available for all compatible iPhone and iPadOS models. These builds, identified by version number 23A340, are ...

Microsoft has released new firmware updates for Surface Laptop 7th Edition and Surface Pro 11th Edition, the Snapdragon X-based Copilot+ PCs it first shipped in mid-2024. That is, these updates are ...

Abstract: Steel surface defect detection is a crucial aspect of the steel manufacturing process, serving as an essential guarantee for enhancing the quality of steel production. Detecting surface ...

Integration is unable to connect to my RT-AC86U on Merlin Firmware 386.14_2 (acting as an access point) when I perform the update to Core 2025.6.0. The connection still works on my newer asus router ...

Resilience, a lunar lander produced by the Japanese aerospace firm Ispace, has crashed into the Moon's surface. The lander was Ispace's second failed attempt at placing a spacecraft on the Moon; a ...

With its wide-ranging family of hardware, Microsoft has reimagined how we compute—again and again. As the company turns 50, let's revisit the twists and turns of its transformative Surface line. From ...

Cyberint, rebranded as Check Point External Risk Management, offers a comprehensive view of an organization's cyber threats across the open, deep, and dark web REDWOOD CITY, Calif., March 31, 2025 ...

Abstract: In response to the issue of poor detection performance on wafer surface defect spots and elongated scratches, an improved RT-DETR method for wafer surface defect detection is proposed.