Abstract: Transient release of heat due to cracking, interfacial debonding and conductor motion can lead to premature quenching and training in high-field superconducting accelerator magnets.
Abstract: The effect of various trapping centers on single-event transients (SETs) in GaN high-electron-mobility transistors (HEMTs) is examined via calibrated technology computer-aided design (TCAD) ...
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