TestStand 4.0, the test executive software from National Instruments, has several new features designed to shorten test-development cycles. With version 4.0 you can drag and drop tests from a list ...
Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...
When using functional test sequences, test compaction is important to avoid excessive numbers of clock cycles of test application. However, test compaction procedures for binary sequences at the ...
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