Based on FormFactor's scalable MicroSpring interconnect technology, the PH150 probe card enables the testing of 300-mm DRAM wafers in just six touchdowns. The ability to test a wafer in fewer ...
Enhancing the capabilities of the Probilt PB6500 probe card analyzer is a 12" diameter tungsten-carbide measurement chuck with dual cameras and extended stage travel that allows probe arrays as big as ...
STAr Technologies, a leading manufacturer of semiconductor test probe cards, unveiled the new 3D/2.5D MEMS micro-cantilever probe card for WAT reliability testing. The Virgo-Prima Series probe card is ...
Chunghwa Precision Test Tech (CHPT), an IC test interface solutions provider, is optimistic about demand spurred by AI servers and smartphones and projects a surge in probe card orders in the second ...
POWAY, Calif.--(BUSINESS WIRE)--Cohu, Inc. (NASDAQ: COHU), a global supplier of equipment and services optimizing semiconductor manufacturing yield and productivity, today announced a strategic ...
Jena, Germany --Jenoptik has been awarded the Thuringia Innovation Prize 2022 in the "Industry & Materials" category for its novel opto-electronic probe card for PIC wafer testing at a ceremony held ...
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