Minimizing reflections and signal losses in test systems associated with the design, manufacture, and production of RF products can be a complex challenge. In addition to issues such as cable and ...
Developing an automated production test solution for current and next-generation complex RF SIP/SOC devices is an increasingly difficult task. Both the test program and the device interface board (DIB ...
Modern radio frequency (RF) components introduce many challenges to outsourced semiconductor assembly and test (OSAT) suppliers whose objective is to ensure products are assembled and tested to meet ...
It is often necessary to provide some type of shielding in order to perform RF/wireless testing with an acceptable amount of external noise. It is also often necessary to perform testing where the ...
Next-generation wireless applications are increasingly coping with new requirements for latency and higher data transmission rates, leading RF engineers to confront new test challenges at the ...
Michael Powell, chairman of the FCC, will open an RF test laboratory in Columbia, Md., this coming week. The lab, at the FCC’s Office of Engineering and Technology, will feature an RF “anechoic” ...
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